When a multilayered material is analyzed by means of energy-dispersive X-ray fluorescence analysis, then the X-ray ratios of K alpha/K beta, or L alpha/L beta and L alpha/L gamma, for an element in the multilayered material, depend on the composition and thickness of the layer in which the element is situated, and on the composition and thickness of the superimposed layer (or layers). Multilayered samples are common in archaeometry, for example, in the case of pigment layers in paintings, or in the case of gilded or silvered alloys. The latter situation is examined in detail in the present paper, with a specific reference to pre-Columbian alloys from various museums in the north of Peru. (C) 2009 Elsevier B.V. All rights reserved.
Metal location and thickness in a multilayered sheet by measuring K alpha/K beta, L alpha/L beta and L alpha/L gamma X-ray ratios / Cesareo, R; Rizzutto, Ma; Brunetti, Antonio; Rao, Dv. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 267:17(2009), pp. 2890-2896. [10.1016/j.nimb.2009.06.119]