A PROFILE-FITTING PROCEDURE FOR ANALYSIS OF BROADENED X-RAY-DIFFRACTION PEAKS .2. APPLICATION AND DISCUSSION OF THE METHODOLOGY / Benedetti, A; Fagherazzi, G; Enzo, Stefano; Battagliarin, M.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 21:(1988), pp. 543-549. [10.1107/S0021889888006624]
A PROFILE-FITTING PROCEDURE FOR ANALYSIS OF BROADENED X-RAY-DIFFRACTION PEAKS .2. APPLICATION AND DISCUSSION OF THE METHODOLOGY
ENZO, Stefano;
1988-01-01
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