This paper presents a robust and dynamic face recognition technique based on the extraction and matching of devised probabilistic graphs drawn on SIFT features related to independent face areas. The face matching strategy is based on matching individual salient facial graph characterized by SIFT features as connected to facial landmarks such as the eyes and the mouth. In order to reduce the face matching errors, the Dempster-Shafer decision theory is applied to fuse the individual matching scores obtained from each pair of salient facial features. The proposed algorithm is evaluated with the ORL and the IITK face databases. The experimental results demonstrate the effectiveness and potential of the proposed face recognition technique also in case of partially occluded faces.

Maximized posteriori attributes selection from facial salient landmarks for face recognition / Gupta, P; Kisku, D; Sing, J; Tistarelli, Massimo. - 76:(2010), pp. 1-8. ( 2nd International Conference on Advanced Science and Technology Miyazaki, Japan June 23-25, 2010) [10.1007/978-3-642-13577-4_29].

Maximized posteriori attributes selection from facial salient landmarks for face recognition

TISTARELLI, Massimo
2010-01-01

Abstract

This paper presents a robust and dynamic face recognition technique based on the extraction and matching of devised probabilistic graphs drawn on SIFT features related to independent face areas. The face matching strategy is based on matching individual salient facial graph characterized by SIFT features as connected to facial landmarks such as the eyes and the mouth. In order to reduce the face matching errors, the Dempster-Shafer decision theory is applied to fuse the individual matching scores obtained from each pair of salient facial features. The proposed algorithm is evaluated with the ORL and the IITK face databases. The experimental results demonstrate the effectiveness and potential of the proposed face recognition technique also in case of partially occluded faces.
2010
Inglese
4th International Conference on Information Security and Assurance, ISA 2010
Contributo
2nd International Conference on Advanced Science and Technology
76
1
8
8
978-3-642-13364-0
http://link.springer.com/chapter/10.1007/978-3-642-13365-7_1
Springer-Verlag
BERLIN HEIDELBERG
STATI UNITI D'AMERICA
Esperti anonimi
June 23-25, 2010
Miyazaki, Japan
Internazionale
Face recognition; Statistical analysis; Pattern recognition
Maximized posteriori attributes selection from facial salient landmarks for face recognition / Gupta, P; Kisku, D; Sing, J; Tistarelli, Massimo. - 76:(2010), pp. 1-8. ( 2nd International Conference on Advanced Science and Technology Miyazaki, Japan June 23-25, 2010) [10.1007/978-3-642-13577-4_29].
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Gupta, P; Kisku, D; Sing, J; Tistarelli, Massimo
273
4
none
info:eu-repo/semantics/conferenceObject
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11388/75301
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