Face sketch recognition is an important task for forensic investigations. In the last decades most of the sketches used by law enforcement agencies are composites made from real photos, using some specialized software. In this work we propose a new method for the automatic recognition of these composite sketches. We propose to use deep learning features extracted from facial components to represent the sketches. We decide to use intermediate layers from already trained deep models and we employ a metric learning approach, as an easier way to learn the differences between sketch and photo domains. The experimental evaluation conducted on two available databases, shows the superiority of the proposal with respect to the use of the original deep models, as well as to other state-of-the-art methods.

Local deep features for composite face sketch recognition / Mendez-Vazquez, H., Becerra-Riera, F., Morales-Gonzalez, A., Lopez-Avila, L., Tistarelli, M.. - (2019), pp. 1-6. (7th International Workshop on Biometrics and Forensics, IWBF 2019 mex 2019) [10.1109/IWBF.2019.8739212].

Local deep features for composite face sketch recognition

Mendez-Vazquez H.
;
Tistarelli M.
2019-01-01

Abstract

Face sketch recognition is an important task for forensic investigations. In the last decades most of the sketches used by law enforcement agencies are composites made from real photos, using some specialized software. In this work we propose a new method for the automatic recognition of these composite sketches. We propose to use deep learning features extracted from facial components to represent the sketches. We decide to use intermediate layers from already trained deep models and we employ a metric learning approach, as an easier way to learn the differences between sketch and photo domains. The experimental evaluation conducted on two available databases, shows the superiority of the proposal with respect to the use of the original deep models, as well as to other state-of-the-art methods.
2019
Inglese
2019 7th International Workshop on Biometrics and Forensics, IWBF 2019
7th International Workshop on Biometrics and Forensics, IWBF 2019
1
6
6
978-1-7281-0622-9
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8735658
Institute of Electrical and Electronics Engineers Inc.
STATI UNITI D'AMERICA
Esperti anonimi
Sì
2019
mex
Internazionale
Composite sketches; face sketch recognition; Local deep learning
Local deep features for composite face sketch recognition / Mendez-Vazquez, H., Becerra-Riera, F., Morales-Gonzalez, A., Lopez-Avila, L., Tistarelli, M.. - (2019), pp. 1-6. (7th International Workshop on Biometrics and Forensics, IWBF 2019 mex 2019) [10.1109/IWBF.2019.8739212].
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Mendez-Vazquez, H.; Becerra-Riera, F.; Morales-Gonzalez, A.; Lopez-Avila, L.; Tistarelli, M.
273
5
none
info:eu-repo/semantics/conferenceObject
   H2020
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11388/228528
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