In the present work we report a study of the light response of a CsI(Tl) crystal readout by a SiPM to low energy protons, accelerated by the Tandem Van der Graaf at the Laboratori Nazionali del Sud (LNS)-INFN, Catania, Italy. The light yield was measured for protons of different kinetic energies, from 2.5 MeV to 24 MeV. We also derived the light attenuation length. The results of this work indicate that a CsI coupled with a SiPM-based modern readout solution allows for the detection of low energy signals.

Performance of a SiPM-based readout of a large CsI(Tl) crystal irradiated with low energy protons / Bondi, M.; Battaglien, M.; Carpinelli, M.; Celentano, A.; De Napoli, M.; De Vita, R.; Leonora, E.; Marsicano, L.; Randazzo, N.; Sipala, V.. - 2017-:(2017), pp. 1-2. (Intervento presentato al convegno 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 tenutosi a fra nel 2016) [10.1109/NSSMIC.2016.8069804].

Performance of a SiPM-based readout of a large CsI(Tl) crystal irradiated with low energy protons

Carpinelli, M.;Sipala, V.
2017-01-01

Abstract

In the present work we report a study of the light response of a CsI(Tl) crystal readout by a SiPM to low energy protons, accelerated by the Tandem Van der Graaf at the Laboratori Nazionali del Sud (LNS)-INFN, Catania, Italy. The light yield was measured for protons of different kinetic energies, from 2.5 MeV to 24 MeV. We also derived the light attenuation length. The results of this work indicate that a CsI coupled with a SiPM-based modern readout solution allows for the detection of low energy signals.
2017
9781509016426
Performance of a SiPM-based readout of a large CsI(Tl) crystal irradiated with low energy protons / Bondi, M.; Battaglien, M.; Carpinelli, M.; Celentano, A.; De Napoli, M.; De Vita, R.; Leonora, E.; Marsicano, L.; Randazzo, N.; Sipala, V.. - 2017-:(2017), pp. 1-2. (Intervento presentato al convegno 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 tenutosi a fra nel 2016) [10.1109/NSSMIC.2016.8069804].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11388/211637
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