Zinc oxide (ZnO) nanoparticles have been prepared by a wet chemical method, from zinc acetate and LiOH ethanol-based solutions. The resulted nanoparticles were dispersed in a solvent. The effect of solvent (ethanol or butanol) and surfactant (polyethylene glycol-PEG 200) on the average size and size distribution of the nanoparticles was investigated by light scattering measurements. Smaller size was observed for ZnO nanoparticles dispersed in butanol and PEG 200. The statistical parameters of the Gaussian size distribution curves were calculated. ZnO nanoparticles have been prepared to be used as seeds on a substrate for the growth of ZnO nanowires. The morphology, surface roughness, crystalline structure, and orientation of the nanoparticles deposed on silicon substrate were characterized by atomic force microscopy and x-ray diffraction, respectively.
Liquid-Phase Preparation and Characterization of Zinc Oxide Nanoparticles / Monica, Mazilu; Viorica, Musat; Innocenzi, Plinio; Tongjit, Kidchob; Daniela, Marongiu. - In: PARTICULATE SCIENCE AND TECHNOLOGY. - ISSN 0272-6351. - 30:1(2012), pp. 32-42. [10.1080/02726351.2010.544016]
Liquid-Phase Preparation and Characterization of Zinc Oxide Nanoparticles
INNOCENZI, Plinio;
2012-01-01
Abstract
Zinc oxide (ZnO) nanoparticles have been prepared by a wet chemical method, from zinc acetate and LiOH ethanol-based solutions. The resulted nanoparticles were dispersed in a solvent. The effect of solvent (ethanol or butanol) and surfactant (polyethylene glycol-PEG 200) on the average size and size distribution of the nanoparticles was investigated by light scattering measurements. Smaller size was observed for ZnO nanoparticles dispersed in butanol and PEG 200. The statistical parameters of the Gaussian size distribution curves were calculated. ZnO nanoparticles have been prepared to be used as seeds on a substrate for the growth of ZnO nanowires. The morphology, surface roughness, crystalline structure, and orientation of the nanoparticles deposed on silicon substrate were characterized by atomic force microscopy and x-ray diffraction, respectively.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
